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Igor Aleksejev, Artur Jutman, Jaan Raik, Raimund Ubar. Application of Sequent... (0) |
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Raimund Ubar, Jaan Raik, Artur Jutman, Maksim Jenihhin, Martin Instenberg, He... (0) |
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Jaan Raik, Hideo Fujiwara, Anna Krivenko. RT-Level Identification of Potentia... (0) |
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Jaan Raik, Uljana Reinsalu, Raimund Ubar, Maksim Jenihhin, Peeter Ellervee. F... (0) |
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Andres Mellik, Jaan Raik. An XML-based Test Development and Deployment Framew... (0) |
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Artur Jutman, Igor Aleksejev, Jaan Raik, Raimund Ubar. Reseeding Using Compac... (0) |
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Jaan Raik, Hideo Fujiwara, Raimund Ubar, Anna Krivenko. Untestable Fault Iden... (0) |
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Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman. Parallel Fault Backtra... (0) |
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Maksim Jenihhin, Jaan Raik, Anton Chepurov, Raimund Ubar. Temporally Extended... (0) |
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Jaan Raik, Raimund Ubar, Taavi Viilukas, Maksim Jenihhin. Mixed Hierarchical-... (0) |
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| Contact |
| ELIKO Competence Centre in Electronics-, Info- and Communication Technologies |
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Teaduspargi 6/2
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Tallinn, 12618
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Phone: +372 65 99 881
Fax: +372 65 99 880
KMK nr: EE100914193
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E-mail: info@eliko.ee
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Copyright © 2005-2009 Eliko Tehnoloogia Arenduskeskus OÜ, All rights reserved |
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